optics-2017-scientifictracks-abstracts

94 / 99

Page 145
Notes:
conferenceseries .com
Volume 4, Issue 4 (Suppl) J Laser Opt Photonics, an open access journal
ISSN: 2469-410X Optics 2017
November 15-17, 2017
November 15-17, 2017 | Las Vegas, USA
8th International Conference and Exhibition on
Lasers, Optics & Photonics
Mapping surface plasmon polaritons by near-infrared dual-probe scanning near-field optical
microscope
Najmeh Abbasirad
Friedrich Schiller University Jena, Germany
S canning near-field optical microscopy (SNOM) is a powerful technique to visualize optical phenomena within the near-
field region of optical nanostructure. In standard aperture SNOM measurements, there is a small aperture which serves as
a point-like emitter or detector of light. In dual-probe SNOM, there are two aperture tips which simultaneously illuminate and
collect the light on a surface of nanostructures. In the dual-probe configuration, both illumination and collection resolution
depends on the aperture size and can overcome the diffraction limit. Furthermore, the measurement signal is not influenced
by background radiation stemming from an illumination laser spot. Although the dual-probe SNOM measurements have
been reported for the measurement of surface plasmon polaritons (SPPs) propagation as well as local carrier dynamics in
quantum wells, due to complications of dual-probe SNOM measurements, this technique is not yet a common near-field
characterization method. Recently, we have introduced a fully automated and robust dual-probe SNOM technique which
has facilitated the robust implementation of the measurement. In this technique, a reliable collision avoidance scheme only
based on shear force interaction between two tips is employed. The fully automated dual-probe technique not only simplifies
the application of dual-probe SNOM, but a low noise electronic also leads to considerably improved data acquisition. In this
work, we demonstrate the capability and stability of the method by measuring SPPs propagation for near-infrared excitation.
The illumination probe excited SPPs on a gold film at 1550 nm wavelength. The SPP propagation is mapped on an area around
the illumination probe by raster scanning of the collection probe. A computer-controlled collision avoidance scheme prevents
the collision of two probes. Therefore, the optical signal is mapped without user interference. The fully automated dual-probe
SNOM could open up a new possibility to quantitatively investigate and image the optical field interaction with plasmonic and
dielectric devices as well as surface wave propagation.
Biography
Najmeh Abbasirad is currently pursuing her PhD in Nano-optics group at the Institute of Applied Physics, Friedrich Schiller University Jena under supervision of Prof.
Thomas Pertsch. At present her research focuses on near-field optical microscopy and developing dual-probe SNOM for characterization of optical nanostructures.
Najmeh Abbasirad, J Laser Opt Photonics 2017, 4:4 (Suppl)
DOI: 10.4172/2469-410X-C1-017