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Volume 4, Issue 4 (Suppl) J Laser Opt Photonics, an open access journal
ISSN: 2469-410X Optics 2017
November 15-17, 2017
November 15-17, 2017 | Las Vegas, USA
8th International Conference and Exhibition on
Lasers, Optics & Photonics
Automatized optical quality assessment of photovoltaic modules
Johannes Hepp1,3 Andreas Vetter1,2, Christian Camus1, Jens Hauch1 and Christoph J Brabec1,2
1Bavarian Center for Applied Energy Research, Germany
2Friedrich-Alexander-University, Germany
3Erlangen Graduate School in Advanced Optical Technologies, Germany
Optical measurement techniques open the door to a wide variety of quality inspection tools. However, the number of
customizable settings, like e.g. excitation sources or optical filters, is immense. For the quality inspection of thin film
photovoltaics, we developed a Matlab based analysis tool in order to investigate as many parameters-potentially obtained by
different metrology methods-as possible, in a fast and reproducible way. This tool automatically executes procedures like peak
wavelength detection of luminescence spectra (an indicator for material composition), hot spot detection in IR images (an
indicator for recombination losses) and many mathematical combinations of multiple images taken under varying conditions.
One application of this approach was to separate the effects of material composition from the influence of the defects on the
performance of a photovoltaic module. The combination of these two performance indicators showed a good correlation to
the open circuit voltage of the device, proving the relevance of this analysis approach. Furthermore, the tool was capable of
capturing further refinements following from hardware improvements like the combination of images taken with special IR
filters. This allowed us to combine the benefits of spectral and spatial resolution, which could be used in order to selectively
identify certain chemical substances and their distribution in the sample of interest. The software applies the scripted processing
tasks successively on all samples of a measurement series within minutes, thus enabling high throughput inline measurements.
The implemented graphical user interface (GUI) allows for a flexible and user definable handling.
Biography
Johannes Hepp has completed his MSc in Material Science from Friedrich-Alexander-University Erlangen-Nuremberg (FAU) and started working on his PhD as
Reseacher at Bavarian Center for Applied Energy Research (ZAE Bayern) in February 2015. He is a Doctoral Researcher at the School of Advanced Optical
Technologies Erlangen (SAOT) and has authored/coauthored three publications.
Johannes Hepp et al., J Laser Opt Photonics 2017, 4:4 (Suppl)
DOI: 10.4172/2469-410X-C1-017