19 / 31
Page 57
Notes:
conference
series
.com
Volume 6, Issue 5 (Suppl)
OMICS J Radiol, an open access journal
ISSN: 2167-7964
Radiology and Oncology 2017
October 19-20, 2017
World Congress on
October 19-20, 2017 | New York, USA
Radiology and Oncology
How the combination of new X-ray techniques with new algorithms can support 3D imaging in medicine
A Dommann, R Kaufmann
and
A Neels
Empa-Swiss Federal Laboratories for Materials Science and Technology, Switzerland
C
ombining new x-ray techniques with new algorithms can support the imaging procedure inmedicine. They allow using additional
information channels like X-ray energy or X-ray refraction and diffraction to improve the image contrast and highlight interesting
objects over the background. Ever faster computers enable furthermore complex reconstruction and filtering techniques in the clinic
which were only used for special offline cases so far. Novel developments like spectral CT or iterative reconstructions help to improve
the sensitivity and the contrast of medical imaging. With such tools, it might once be possible to image challenging objects like
cartilage or to segment cancerous and normal tissue. The diagnosis of deseases like chronical pain or early cancer, which is difficult
today, will profit from such developments. But also established methods will gain from these developments. Iterative reconstructions
reduce noise and artefacts; and spectral CT permits an easier rendering of interesting features in the image. Together with micro-CT
and diffraction based analytics, these tools have the potential to advance X-ray techniques also into fields where they are not used
today.
Biography
Alex Dommann is Heading the Department Materials meet Life at Empa. He has received his PhD in Solid State Physics in 1988 from ETHZ in Switzerland. His research
concentrates on the surface analysis, bio surface interactions, structuring, coating and characterization of thin films. He is member of different national and international
committees and teaches Biomaterials, Crystallography and MEMS technology at different Swiss universities and has published more than 150 papers. He is Member of the
Swiss Academy of Engineering Science (SATW) and Adjunct Professor at the University of Berne.
alex.dommann@empa.chA Dommann et al., OMICS J Radiol 2017, 6:5 (Suppl)
DOI: 10.4172/2167-7964-C1-015