X ray diffraction

As per available reports about 122 journals, 12 Conferences, 04 workshops are presently dedicated exclusively to X-ray diffraction and about 167426 articles are being published on the current trends in X-ray diffraction. In terms of research annually, USA, India, Japan, Brazil and Canada are some of the leading countries where maximum studies related to proteomics are being carried out. As reported in X-ray thin-film measurement techniques: The Rigaku Journal, 2008. X-ray diffraction is one of the methods that have been successfully used for the determination of the crystal structure of a material. Though the X-ray diffraction method is a well-known technique, the method should be used after fully recognizing the differences from other evaluation methods and the feature of the method.

The Journal of Radiology is an academic journal – hosted by OMICS International – a pioneer in open access publishing–and is listed among the top 10 journals in X-ray diffraction. Each year research scientists have noticed a rise in the number of congresses being held in this field. The Journal of Radiology provides a unique platform to researchers and scientist to explore the advanced and latest research developments in the field of Xray diffraction .

OMICS International – a pioneer in organizing international conferences OMICS Group Conferences are integrated with workshops, symposia, trade shows and world congresses by bringing together people on a single platform thereby achieving its motto of escalating and enlightening the lamp of knowledge across the world in all the areas of Science, Medicine and Technology.

X-Ray Diffraction (XRD) is a method for identifying the molecular and atomic structure of a crystal. In which when a beam of light is passed over a crystal then it diffracts into many specific directions. By using this crystallographer can produce a three-dimensional structure and the density of the electron within the crystal. The diffraction of X-rays by crystals is given by  Bragg’s Law, n(lambda) = 2d sin(theta)

X-Ray Diffraction (XRD) in other words can be defined as the Measure the average spacing between layers or rows of atoms. We can also find the crystal structure of the unknown compound.