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Kelvin probe force microscopy
Kelvin probe force microscopy is an atomic force microscopy based technique that is used to measure contact potential difference between the probe and the sample. It enables high resolution surface potential and topography mapping of a variety of sample.
Related journals of Kelvin probe force microscopy Japanese Journal of Applied Physics, Journal of Nanotechnology, Journal of Physical Chemistry, Journal of Applied Physics, Journal of Materials Chemistry A
Kelvin probe force microscopy
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