Abstract

Total contemplation Due to its low detection limit and low energy spectrum background count, X-ray fluorescence (TXRF) is frequently employed in trace element, ultra-trace element, and multi-element analysis. This article examines the creation and use of TXRF. Three stages can be identified in the development of TXRF. Total reflection was first introduced in 1971, and from that point until the publication of the first monograph on TXRF in 1997, it was primarily used for single element analysis and theoretical research. From 1998 to 2017, TXRF underwent rapid development, going from single element analysis to multi-element simultaneous analysis, with its primary applications being in the fields of geology, environment, chemistry, and medicine. The third stage is based on extensive application. On its fundamental principles, enhance the instrument’s functionality, and produce more precise analysis findings.