Review of Complete Reflection X-Ray Fluorescence Spectroscopy
Received Date: Apr 01, 2023 / Accepted Date: Apr 27, 2023 / Published Date: Apr 28, 2023
Abstract
Total contemplation Due to its low detection limit and low energy spectrum background count, X-ray fluorescence (TXRF) is frequently employed in trace element, ultra-trace element, and multi-element analysis. This article examines the creation and use of TXRF. Three stages can be identified in the development of TXRF. Total reflection was first introduced in 1971, and from that point until the publication of the first monograph on TXRF in 1997, it was primarily used for single element analysis and theoretical research. From 1998 to 2017, TXRF underwent rapid development, going from single element analysis to multi-element simultaneous analysis, with its primary applications being in the fields of geology, environment, chemistry, and medicine. The third stage is based on extensive application. On its fundamental principles, enhance the instrument’s functionality, and produce more precise analysis findings.
Citation: Nomi B (2023) Review of Complete Reflection X-Ray Fluorescence Spectroscopy. J Anal Bioanal Tech 14: 509.
Copyright: © 2023 Nomi B. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
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