Abstract

X-ray diffraction is a powerful analytical technique that serves as the foundation of X-ray crystallography, enabling the detailed investigation of atomic and molecular structures. This abstract presents an overview of the principles underlying X-ray diffraction, from the interaction of X-rays with matter to the interpretation of diffraction patterns. When X-rays encounter a crystalline material, they are scattered by the electrons surrounding the atoms, creating a unique diffraction pattern that is characteristic of the crystal's internal structure. We discuss key concepts such as Bragg's law, the reciprocal lattice, and the significance of symmetry in crystal systems. Furthermore, we explore the role of X-ray diffraction in determining structural information about a wide range of materials, including organic compounds, inorganic crystals, and biological macromolecules. This review also highlights recent advancements in instrumentation and data analysis techniques that enhance the resolution and speed of diffraction experiments. By elucidating the fundamental principles and applications of X-ray diffraction, this work underscores its critical importance in advancing our understanding of material properties and chemical behavior.