Abstract

X-ray imaging has emerged as a powerful tool in the field of Nano crystallography, enabling the exploration of crystalline materials at the Nano-scale with exceptional detail. This abstract highlights the latest advancements in X-ray imaging techniques and their application to Nano-scale crystallography, emphasizing their significance in understanding material properties and behaviors. By leveraging high-resolution X-ray diffraction and scattering methods, researchers can probe the structural characteristics of Nano crystals, revealing critical information about size, shape, orientation, and defects. These insights are crucial for optimizing the performance of Nano-materials in various applications, including electronics, catalysis, and drug delivery. Recent developments in synchrotron radiation and coherent X-ray sources have further enhanced imaging capabilities, allowing for three-dimensional visualization of Nanostructures and the study of dynamic processes in real time. This review discusses the implications of these advancements, demonstrating how X-ray imaging at the Nano-scale not only deepens our understanding of fundamental crystallography but also paves the way for innovations in Nanotechnology and material science.