Characterization Techniques for Nanomaterials: A Comprehensive Review
Received Date: Mar 01, 2024 / Published Date: Mar 29, 2024
Abstract
This paper provides an in-depth review of characterization techniques used in the analysis of nanomaterials. It discusses methods such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM), emphasizing their applications and limitations in understanding the properties of nanomaterials.
Citation: Michael L (2024) Characterization Techniques for Nanomaterials: AComprehensive Review. J Mater Sci Nanomater 8: 121.
Copyright: © 2024 Michael L. This is an open-access article distributed under theterms of the Creative Commons Attribution License, which permits unrestricteduse, distribution, and reproduction in any medium, provided the original author andsource are credited.
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