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Michael Le

Department of Materials Science, MIT, India
Publications

Characterization Techniques for Nanomaterials: A Comprehensive Review

This paper provides an in-depth review of characterization techniques used in the analysis of nanomaterials. It discusses methods such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM), emphasizing their applications and limitations in understanding the properties of nanomaterials.... Read More»

Michael Le

: J Mater Sci Nanomater 8: 121.

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