Thickness

As per available reports about 124 journals, 87 Conferences, 102 workshops are presently dedicated exclusively to Material Thickness and about 148030 articles are being published on the current trends in Material Thickness. In terms of research annually, USA, India, Japan, Brazil and Canada are some of the leading countries where maximum studies related to Material Thickness are being carried out. The distance between the top and bottom or front and back surfaces of layer of a material (thin film) of is called Thickness. As reported in “The determination of thin film thickness using reflectance spectroscopy” by Hind and Chomette, Thin films, layers of one material deposited on another material, are significant in many high-technology industries. The characterization of thin films is extremely important in many optics/photonics applications like semiconductor, micro-machining, defence, architectural glass and flat panel displays, with parameters of interest including film thickness, refractive index, coating homogeneity and reflectivity.

The Journal of Nanomedicine & Nanotechnology is an academic journal – hosted by OMICS International – a pioneer in open access publishing–and is listed among the top 10 journals on Material Thickness. Each year research scientists have noticed a rise in the number of congresses being held in this field. The Journal of Nanomedicine & Nanotechnology provides a unique platform to researchers and scientist to explore the advanced and latest research developments in the field of Material Thickness, thus bridging the gap between researchers and young scientists.

OMICS Group is organizing 4^th International Conference & Exhibition on Nanotek & Expo with the theme "Challenging Aspects and Frontiers in Nanoscience & Nanotechnology” with a well reputed organizing committee during Dec 01-03, 2014, DoubleTree by Hilton Hotel San Francisco Airport, San Francisco, USA.